スポンサーリンク
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn | 論文
- Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System
- Quantitative Evaluation of Dopant Concentration in Shallow Silicon p-n Junctions by Tunneling Current Mapping with Multimode Scanning Probe Microscopy (Special Issue : Solid State Devices and Materials)
- Thermal Conductivity of Amorphous Indium-Gallium-Zinc Oxide Thin Films