スポンサーリンク
Nagoya university | 論文
- Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images
- Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-Rays by Electron Impact (Short Note)
- Fourier analysis of HRTEM image deterioration caused by mechanical vibration
- Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum
- Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
- Flattening of Surface by Sputter-Etching with Low-Energy Ions : Instrumentation, Measurement, and Fabrication Technology
- Floating-type Compact Low-energy Ion Gun - Basic Performance for High-resolution Depth Profiling -
- Monte Carlo Simulation of Generations of Continuous and Characteristic X-Rays by Electron Impact
- Optimization of voltage axis alignment in high-resolution electron microscopy
- Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
- Development of a real-time defocus image modulation processing electron microscope. I. Construction
- TEM Study of the Interface Structure of CVD Diamond Heteroepitaxilly Grown on Pt(111) Substrate
- 単結晶LiTaO_3における分極反転ドメインの断面透過電子顕微鏡観察
- Evaluation of image drift correction by three-dimensional Fourier analysis
- Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
- Cross-Sectional Transmission Electron Microscope Observation of Isolated Diamond Particles Heteroepitaxially Grown on Pt(111) Substrate
- Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM
- Y-TZP/M型ヘキサフェライトコンポジットのin situプロセッシング
- In Situセラミックコンポジットに適したAl^置換LaM型ヘキサフェライトの合成
- MICROSTRUCTURAL BARRIERS AND FATIGUE LIMIT OF LOW CARBON STEEL