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Microelectronics Center At Chalmers And Department Of Physics University Of Goteborg And Chalmers Un | 論文
- Electron Transport in Nanocrystalline Si Based Single Electron Transistors
- Atomic Force Microscope Current-Imaging Study for Current Density through Nanocrystalline Silicon Dots Embedded in SiO_2
- Dark Current in Quantum Dot Infrared Photodetectors
- Effect of Donor Space Charge on Electron Capture Processes in Quantum Well Infrared Photodetectors
- High-Frequency Response of Metal-Semiconductor-Metal Photodetectors Limited by Dynamic and Recombination Effects
- Resonant-Tunneling Bipolar Transistors with a Quantum-Well Base
- Carrier Transport Across Metal-Polymer Barriers
- Thermal Noise in Silicon Bipolar Transistors and Circuits for Low-Current Operation : Part I: Compact Device Model
- Atomic Force Microscope Current-Imaging Study for Current Density through Nanocrystalline Silicon Dots Embedded in SiO2