スポンサーリンク
Mechanical Engineering Laboratory | 論文
- Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection
- Subspace-Based Blind Detection of Space-Time Coding (Wireless Communication Technologies)
- A Wavelets Network Interpolation Algorithm for OFDM Channel Estimation Systems(Multi-carrier Signal Processing Techniques for Next Generation Mobile Communications-Part 2)
- Research on Diamond Turning of an Al Alloy Mirror
- The Ignition of H_2-O_2-O_3 / H_2-O_2-O_3-Ar Mixture Induced by the Photolysis of Ozone
- Observation of Atormic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
- Study of Field Emission Characteristics of Carbon with the Scanning Atom Probe
- Joint MMSE Vector Precoding Based on GMD Method for MIMO Systems(Wireless Communication Technologies)
- Lattice-Reduction-Aided MMSE Tomlinson-Harashima Precoding for MIMO Systems(Wireless Communication Technologies)
- Study on Nano-machining Process Using Mechanism of a Friction Force Microscope
- Development of a New Measurement Method of Central Position of Spindle Rotation : 1st Report : Steel Ball Method
- Motion planning of multiple mobile robots by a combination of learned visibility graphs and virtual impedance
- X-Ray Diffraction and Scanning Electron Microscopy Observation of Lead Zirconate Titanate Thick Film Formed by Gas Deposition Method
- A Study of the Dynamic Damper with a Preview Action : Experiment of the Dynamic Damper with a Preview Action
- Identification of Nonlinear Multi-Degree-of-Freedom Systems : Identification Under Noisy Measurements
- Identification of Nonlinear Multi-Degree-of-Freedom Systems : Presentation of an Identification Technique
- Room-Temperature Bonding of Si Wafers to Pt Films on SiO_2 or LiNbO_3 Substrates Using Ar-Beam Surface Activation
- Transmission Electron Microscope Observations of Si/Si Interface Bonded at Room Temperature by Ar Beam Surface Activation
- Effect of Surface Roughness on Room-Temperature Wafer Bonding by Ar Beam Surface Activation
- Vectorial Tolerancing in Manufacturing Process Control