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Materials Research Laboratory, NGK Insulators, Ltd. | 論文
- Surface Characterization of 3C-SiC Exposed to XeF_2
- Thermal Desorption Behavior of AIF_3 Formed on Al_2O_3
- Identification of Desorption Products from the Thermal Reaction of AIN with XeF_2 Vapor Using Molecular Beam Mass Spectrometry and a Time-of-Flight Technique
- Structural and Optical Characterization of Semiconducting TiN Nanoparticles Thin Film
- IGTC-118 Dynamic Fatigue of Sintered Si_3N_4(Organized Session IV CERAMICS FOR GAS TURBINES AND TURBOCHARGERS)