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Korea Electronics Technology Institute Electronics Devices Research Center | 論文
- Defects study of retrograde twin well CMOS that has MeV ion implanted buried layer
- Defects study of retrograde twin well CMOS that has MeV ion implanted buried layer
- High Efficiency 400dpi AlGaAs LED Array Fabrication for PMS(Polygon Mirror Scanning) (第5回日韓台中情報ディスプレイ合同研究会(ASID '99))
- High Efficiency 400dpi AIGaAs LED Array Fabrication for PMS (Polygon Mirror Scanning)
- A Normalization Method for Relationship between Yield Stress and Delayed Hydride Cracking Velocity in Zr-2.5Nb Alloys
- Effect of a Magnetic Field on the Flow Assisted Corrosion of Low Alloy Steel in an Alkaline Solution