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Keihanna Research Laboratory, Shimadzu Corporation | 論文
- Temperature Compensated Piezoresistor Fabricated by High Energy Ion Implantation
- Room-Temperature Epitaxial Growth of CeO_2 Thin Films on Si(111) Substrates for Fabrication of Sharp Oxide/Silicon Interface
- Coaxial Impact Collision Ion Scattering Spectroscopy Measurements of As/Si(100) Structure Prepared by Ionized Cluster Beam Method
- High Energy Ion Beam Analyzer System IBA-9900