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JST, CREST | 論文

• Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
• PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices
• Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process
• SS-mPMG and SS-GA : Tools for Finding Pathways and Dynamic Simulation of Metabolic Networks

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