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JEOL Co. Ltd | 論文
- Transmiccion electron microscopy study of a semiconducting SrTiO_3 ceramic condenser
- Cross-Sectional Transmission Electron Microscopy of ZnO Tetrapod-Like Particles
- High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO_2/SiO_2/Si metal-oxide-semiconductor structures
- Retrieval process of high-resolution HAADF-STEM images
- Artificial bright spots in atomic-resolution high-angle annular dark field STEM images
- High-resolution transmission electron microscopy of Fe-Al powder particles
- A new specimen preparation method for cross-section TEM using diamond powders
- EELS elemental mapping of a DRAM with FE-TEM
- EDS elemental mapping of a DRAM with an FE-TEM
- A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder
- Direct imaging of Guinier-Preston zones by high-angle annular detector dark-field scanning transmission electron microscopy
- Quantification of Oxygen Vacancies in Parasite using a 300 kV HREM with an Imaging Plate