スポンサーリンク
Instrument Division, Hitachi Ltd | 論文
- Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
- Development of a real-time defocus image modulation processing electron microscope. I. Construction
- Spatially-resolved EELS analysis of multilayer using EFTEM and STEM
- Development of a real-time jump-ratio imaging system equipped with a STEM
- Transmission Electron Microscope Sample Shape Optimization for Energy Dispersive X-Ray Spectroscopy Using the Focused Ion Beam Technique