スポンサーリンク
Institute Of Scientific Instruments Of The Ascr V.v.i. | 論文
- Cathode Lens Mode of the SEM in Materials Science Applications
- The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites
- Fine Structure of Wing Scales in Chrysozephyrus Ataxus Butterflies
- FIB Induced Damage Examined with the Low Energy SEM
- Grain Contrast Imaging in UHV SLEEM
- Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
- Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films