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IMEC Leuven, SPDT Division, Kapeldreef 75, B-3001 Leuven, Belgium | 論文
- Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure
- Performance of Direct Tunneling Floating Gate Memory with Medium-$\kappa$ Dielectrics for Embedded-Random-Access Memory Applications
- Enhanced Tunneling Current Effect for Nonvolatile Memory Applications