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Hantech Co. Ltd. | 論文
- Microroughness Reduction of Tungsten Films by Laser Polishing Technology with a Line Beam
- Excimer Laser Annealing with a Line Beam for Improvement of Structural and Optical Properties of Polycrystalline GaN
- Dry Cleaning Technology of Silicon Wafer with a Line Beam for Semiconductor Fabrication by KrF Excimer Laser
- Measurement of Piezoelectric Displacements of Pb(Zr, Ti)O_3 Thin Films Using a Double-Beam Interferometer
- The Efficiency of 10% Carbamide Peroxide Gel on Dental Enamel
- Changes in Bovine Enamel after Treatment with a 30% Hydrogen Peroxide Bleaching Agent
- A Novel Feature Selection for Fuzzy Neural Networks for Personalized Facial Expression Recognition(Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications(ITC-CSCC 2003))
- Microroughness Reduction of Tungsten Films by Laser Polishing Technology with a Line Beam