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General Purpose Computer Division, Hitachi, Ltd. | 論文
- A 1.5-ns Cycle-Time 18-kb Pseudo-Dual-Port RAM with 9K Logic Gates (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))
- A 120-MHz BiCMOS Superscalar RISC Processor (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))
- Solder Joint Inspection Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method (Special Section on Machine Vision Applications)
- Recognition of Fatal Defects in Circuit Patterns
- Automated Inspection of Printed Circuit Board Patterns Referenced to CAD Data
- REDUCT: A Redundant Fault Identification Algorithm Using Circuit Reduction Techniques (Special Issue on VLSI Testing and Testable Design)
- System for Inspecting Defects on the Inner Wall of High-aspect-ratio Through-holes in Printed Circuit Boards