スポンサーリンク
Fujitsu Limited, 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan | 論文
- Full-Chip Lithography Verification for Multilayer Structure in Electron-Beam Lithography
- Direct Measurement of Offset Spacer Effect on Carrier Profiles in Sub-50 nm p-Metal Oxide Semiconductor Field-Effect Transistors