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Eltran Project Device Development Center Canon Inc. | 論文
- Defect Engineering in Epitaxial Layers over Porous Silicon for ELTRAN^【○!R】 SOI Wafers
- Extremely Low Si Etching (
- Current Progress in Epitaxial Layer Transfer (ELTRAN^[○!R]) (Special Issue on SOI Devices and Their Process Technologies)
- Advanced Quality in Epitaxial Layer Transfer by Bond and Etch-back of Porous Si
- Advanced Quality in Epitaxial Layer Transfer by Bond and Etch-Back of Porous Si
- Extremely High Selective Etching of Porous Si for Single Etch-Stop Bond-and-Etch-Back Silicon-on-Insulator
- Complex Form Bandpass Sampling with Offset Frequency Sampling and Quadrature Component Interpolation for Modulated Signals(Software Defined Radio Technology and Its Applications)
- Development of 60Gb/s-Class Parallel Optical Interconnection Module (ParaBIT-1)(Special Issue on Optical Interconnects/Optical Signal Processing)
- A New Optical Interface Structure for Parallel Optical Interconnect Module(Special Issue on Current Electromechanical Devices and Their Materials with Recent Innovations)
- ParaBIT : Parallel Optical Interconnection for Large-Capacity ATM Switching Systems (Joint Special Issue on Photonics in Switching : Systems and Devices)
- ParaBIT: Parallel Optical Interconnection for Large-Capacity ATM Switching Systems (Joint Special Issue on Photonics in Switching : Systems and Devices)
- Multiport Optical Bare-Fiber Connector for Parallel Optical Interconnect Module (Special Issue on Electromechanical Devices and Their Materials)
- Complex Form Bandpass Sampling with Offset Frequency Sampling and Quadrature Component Interpolation for Modulated Signals