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Department of Electronics and Mechanical Engineering, Chiba University | 論文
- Trajectory Transition Due to Gate Depletion in Corrugation Gated Quantum Wires
- Electron Wave Interference in Ballistic and Quasi-Ballistic Nanostructures
- Study of Scattering Processes in Quantum Wires by a Correlation Field Analysis of the Phase Coherent Interferences
- The Magnetic Field Dependent Characteristics of Conductance Fluctuations in Ballistic Quantum Dots
- Experimental Determination of the Conduction Width in Quasi Ballistic Wires
- Ar Ion Laser-Assisted MOVPE of ZnSe Using DMZn and DMSe as Reactants
- Effects of Substrate Materials and Their Properties on Photoassisted Metalorganic Vapor Phase Epitaxy of ZnSe
- Interference Area of Universal Conductance Fluctuations in Narrow GaAs/AlGaAs Wires
- Effect of Precise Control of V/III Ratio on In-Rich InGaN Epitaxial Growth
- Excitation of Magnetostatic Surface Waves by Slot Line Transducers (Special Issue on Microwave and Millimeter Wave Technology)
- Excitation of Magnetostatic Surface Wave by Coplanar Waveguide Transducers
- Citric Acid Etching of ZnSe Surface and Application to the Homoepitaxy by Molecular Beam Epitaxy
- Atomically Flat GaAs(001) Surfaces Obtained by High-Temperature Treatment with Atomic Hydrogen Irradiation
- Reduction of Beam Divergence Angle by Low-Refractive-Index Layers Introduced to Real-Refractive-Index-Guided GaAlAs High-Power Laser Diodes
- 120 mW High-Power Low-Noise GaAlAs Multiple-Quantum-Well Laser Diodes with a New Real Refractive Index Guided Self-Aligned Structure
- Electrical and Photoluminescence Properties of Iodine-Doped ZnSe Films Grown by Low-Pressure MOVPE : Semiconductors and Semiconductor Devices
- Photoluminescence Properties of Nitrogen-Doped ZnSe Films Grown by Low-Pressure MOVPE : Semiconductors and Semiconductor Devices
- Photoluminescence Properties of Li-Doped ZnSe Films Grown by Metalorganic Chemical Vapor Deposition : Semiconductors and Semiconductor Devices
- Polynomial Approximation of SAW Reflection Characteristics for Fast Device Simulation Tools
- Cross-Sectional Transmission Electron Microscope Observation of Small Structures Made by Field-Induced Scanning Tunneling Microscope Fabrication