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Department of Electronic Science and Engineering, Kyoto University | 論文
- Submolecular-Resolution Studies on Metal-Phthalocyanines by Noncontact Atomic Force Microscopy
- Investigations of Nanoparticles by Scanning Near-Field Optical Microscopy Combined with Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
- Orientation Control of Molecular Chains in Polymers Using Atomic Force Microscopy
- Noncontact Atomic Force Microscopy Investigation of Phase-Separated Alkanethiol Self-Assembled Monolayers with Different Head Groups
- Pyroelectricity of Ferroelectric Vinylidene Fluoride-Oligomer-Evaporated Thin Films
- Nanoscale Investigation of Optical and Electrical Properties by Dynamic-Mode Atomic Force Microscopy Using a Piezoelectric Cantilever
- Nanoscale Electrical Properties of Molecular Films in the Vicinity of Platinum Ultrathin Film Electrode
- Fabrication of Nanogap Electrodes Using Ultrathin Metal Film
- Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
- Fabrication of Nanometer-Scale Pattern Using Current-Controlled Scanning Probe Lithography
- Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Aomic Force Microscopy Imaging of Molecular Thin Films
- Domain Orientation Imaging of PbTiO_3 Single Crystalsby Vertical and Lateral Piezoresponse Force Microscopy
- Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy
- Fabrication of a Nanogap on a Metal Nanowire Using Scanning Probe Lithography
- Molecular Ferroelectricity of Vinylidene Fluoride Oligomer Investigated by Atomic Force Microscopy
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy
- Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy
- Investigation of Nonswitching Regions in Ferroelectric Thin Films Using Scanning Force Microscopy
- Dynamic Force Microscopy Investigations of C_ Deposited on Si(111) Surface
- Investigation of Surface Potential of Ferroelectric Organic Molecules by Scanning Probe Microscopy