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Department of Applied Physics, Osaka University | 論文
- Analysis of the DPC4 Gene in Gastric Carcinoma
- Inactivation of the E-Cadherin Gene in Primary Gastric Carcinomas and Gastric Carcinoma Cell Lines
- Loss of Heterozygosity on the Short Arm of Chromosome 9 without p16 Gene Mutation in Gastric Carcinomas
- 25aYL-9 Electronic Properties and Light Emission Rate of linear-trans-quinacridones : Ab Initio Study
- Characterization of Ion Implantation Dose by Raman Scattering and Photothermal Wave Techniques
- Hydrogen and PO_4 Modes of RbH_2PO_4
- Vibrational Modes of Deuterium in KD_2PO_4
- Finite-Temperature Mott Transition in Two-Dimensional Frustrated Hubbard Models(Interaction and Nanostructural Effects in Low-Dimensional Systems)
- Thermopower of Multiorbital Kondo Effect via Single Quantum Dot System at Finite Temperatures(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Tomonaga's Theory for Collective Motion of Fermions : Basic Concept of One-Dimensional Correlated Electrons(YUKAWA-TOMONAGA CENTENNIAL SYMPOSIUM Progress in Modern Physics)
- Microscopic Mechanism and Pairing Symmetry of Superconductivity in the Noncentrosymmetric Heavy Fermion Systems CeRhSI_3 and CeIrSi_3(Condensed matter : electronic structure and electrical, magnetic, and optical properties)
- Magnetic Properties of the Extended Periodic Anderson Model(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Study on Zr-Si/W(100) Surface at High Temperatures by Reflection High Energy Electron Diffraction
- Study on Zr-Si/W(100) Surface at High Temperatures by Combined Surface Analysis Techniques
- 25pPSB-33 First-principles study of halogen-assisted atom abstraction from Cu(111)
- Micro-Raman Characterization of Starting Material for Traveling Liquidus Zone Growth Method
- THE PRINCIPLE AND APPLICATIONS OF OPTICAL MICROSCOPE TOMOGRAPHY (Multiparametric Photometry and Histo-and Cytochemistry)
- Infrared Lattice Reflection Spectra of II-VI Compounds
- The Depth Profiling of the Crystal Quality in Laser-Annealed Polycrystalline Si Films by Raman Microprobe
- Raman Image Measurements of Laser-Recrystallized Polycrystalline Si Films by a Scanning Raman Microprobe