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Department of Applied Physics, Faculty of Engineering, Osaka University | 論文
- Monte Carlo Simulation for Auger Depth Profiling of GaAs/AlAs Superlattice Structure by Ar^+ Ion Sputtering
- Auger Depth Profiles of a GaAs/AlAs Superlattice Structure Obtained with O^+_2 and Ar^+ Ion Sputtering
- Surface Structure of Ion-Implanted Silica Glass
- Multiple-Object Discriminant Filter Generated by Simulated Annealing
- Hybrid Associative Memory Using an Incoherent Correlation System
- Optical Probing for Detecting Surface Displacement Profile of Ultrasound Vibrations : Fundamentals
- Finite Element Simulation of Local Vibration of a Piezoelectric Plate Considering Energy Losses : General Ultrasonics
- Restoration of Diffraction-Limited Noisy Images by Method of Least Squares
- Applicatiotn of the Nonlinear Filtering to the Contrast Enhancement of the Image of the Dislocation Observed by an Electron Microscope
- New Type Interference Selective Modulation Spectroscopy : Spectroscopy
- Photoelectron Counting Statistics of Light Transmitted through Multimode Optical Fiber
- Photoelectron Counting Statistics of Laser Light Scattered by Very Dilute Solution
- Optimization of voltage axis alignment in high-resolution electron microscopy
- Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
- Microfabricated Submicron Al-Filament Biprism as Applied to Electron Holography : Micro/nanofabrication and Devices
- Microfabricated Submicron Al-Filament Biprism as Applied to Electron Holography
- Extraction of Spherical and Chromatic Aberration -free Information by Focal-depth Extension Processing Under Tilted Illumination
- Surface Structure of Zr-O/W(100) System at 1700 K
- Anomaly in Sputtering on Titanium Nitride Film Growth by Post-Irradiation Processing
- Work Function Change Measured by Electron Beam Chopping Technique as Applied to Oxygen-Adsorbed W(100) at High Temperature