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Department Of Quantum Engineering Nagoya Unviersity | 論文

• Cross-Sectional Potential Imaging of Compound Semiconductor Heterostructure by Kelvin Probe Force Microscopy
• Cross-Sectional Potential Imaging of Compound Semiconductor Heterostructure by Kelvin Probe Force Microscopy
• Kelvin Probe Force Microscopy for Potential Distribution Measurement of Cleaved Surface of GaAs Devices
• Kelvin Probe Force Microscopy for Potential Distribution Measurement of Cleaved Surface of GaAs Devices

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