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Department Of Physics Dongguk University | 論文
- The Effects of Cu Diffusion in Cu/TIN/SiO_2/Si Capacitors
- Analysis of Deep-Level Defects on Proton Implanted Polycrystalline Silicon Thin Films Using Photoinduced Current Transient Spectroscopy
- Memory Conductance Switching in a Ni--Ti--O Compound Thin Film
- Visible-Ultraviolet Polarized Reflectivity Spectra of Anisotropically Aligned Single-Walled Carbon Nanotube Films
- Post-Annealing Effects on Fixed Charge and Slow/Fast Interface States of TiN/Al2O3/p-Si Metal–Oxide–Semiconductor Capacitor