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Department Of Electronics Engineering And Inter University Semiconductor Research Center Seoul Natio | 論文
- Time-Varying Body Instability and Low-Frequency Noise Characteristics of Mini-Field-Dual-Body Silicon-on-Insulator Structure for Analog-Digital Mixed-Mode Circuits
- Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs
- AC Floating Body Effects and 1/f Noise Characteristics of Dual Body SOI Structure for Analog-Digital Mixed Mode Circuit
- Under Field Oxide Dopant Enhancement (UFDE) for CMOS and BiCMOS Technology