スポンサーリンク
Department Of Electronic Science And Technology And Key Laboratory For Physical Electronics And Devi | 論文
- The top-bottom effect of a tilted thick specimen and its influence on electron tomography
- Influence of the image quality deterioration of a tilted thick specimen on electron tomography
- Quantitative analysis of static capacitance contrast in scanning electron microscopy
- Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope