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Department Of Electronic Science And Engineering Kyoto University | 論文
- 03-P-06 Heat-Tretment Effect on Poly-Organo-Siloxane Spherical Particles Prepared in W/O Emulsion
- Nanoscale Investigation of Optical and Electrical Properties by Dynamic-Mode Atomic Force Microscopy Using a Piezoelectric Cantilever
- Nanoscale Electrical Properties of Molecular Films in the Vicinity of Platinum Ultrathin Film Electrode
- Fabrication of Nanogap Electrodes Using Ultrathin Metal Film
- Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
- Fabrication of Nanometer-Scale Pattern Using Current-Controlled Scanning Probe Lithography
- Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Aomic Force Microscopy Imaging of Molecular Thin Films
- 非接触原子間力顕微鏡による有機分子薄膜の構造・表面電位評価
- 高分解能非接触原子間顕微鏡による有機分子材料の評価
- 非接触原子間力顕微鏡による有機分子薄膜の局所構造・物性評価
- Domain Orientation Imaging of PbTiO_3 Single Crystalsby Vertical and Lateral Piezoresponse Force Microscopy
- 18pWD-7 計測 : 少数分子系の誘電制御 : 単分子膜から単一分子へ
- Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy
- Fabrication of a Nanogap on a Metal Nanowire Using Scanning Probe Lithography
- Molecular Ferroelectricity of Vinylidene Fluoride Oligomer Investigated by Atomic Force Microscopy
- Structures and Ferroelectric Natures of Epitaxially Grown Vinylidene Fluoride Oligomer Thin Films
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy
- Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy
- Investigation of Nonswitching Regions in Ferroelectric Thin Films Using Scanning Force Microscopy
- 24pZN-2 非接触原子間力顕微鏡の有機分子材料科学への応用