スポンサーリンク
Department Enginyeria Electronica, Universitat Autonoma de Barcelona | 論文
- Soft Breakdown in Ultrathin SiO_2 Layers : the Conduction Problem from a New Point of View
- Experimental Study of the Soft Breakdown I-V Characteristics in Ultrathin SiO_2 Layers
- Quantum Simulation of Resonant Tunneling Diodes : a Reliable Approach Based on the Wigner Function Method
- A New Approach for the Reliable Simulation of Resonant Tunnelling Diodes