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Data Storage Institute Dsi Building | 論文
- Thickness Dependent Nano-Crystallization in Ge_2Sb_2Te_5 films and Its Effect on Devices
- New Approach to Initialization-Free Phase-Change Optical Disk
- Fractal-Based Studies on Irregular Marks of High-Density Phase-Change Optical Media
- New Additional Layer to Realize Initialization-Free Function for Digital Versatile Disk-Random Access Memory Disk
- Study of the Partial Crystallization Properties of Phase-Change Optical Recording Disks
- Dependence of Optical Constants on Film Thickness of Phase-Change Media
- A New Structure of Super-Resolution Near-Field Phase-Change Optical Disk with a Sb_2Te_3 Mask Layer
- Study of the Superlattice-Like Phase Change Optical Recording Disks
- Study of the Multi-Level Reflection Modulation Recording for Phase Change Optical Disks
- New Structure of Dual-Layer Rewritable Phase-Change Optical Disc
- Thermal Analysis of Multi Track Phase Change Optical Recording Using a Special Parallel Recording Array Head
- Elevated-Confined Phase-Change Random Access Memory Cells
- Plastic Deformation and Failure Analysis of Phase Change Random Access Memory
- Multi-Dimensional Multi-Level Optical Pickup Head