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Center For Integrated Systems, Stanford University | 論文

• A 700-MHz Switched-Capacitor Analog Waveform Sampling Circuit (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))
• Analysis of Distortion Behavior Considering Polydepletion Effect in MOS Transistors
• Atomic-Scale and Hierarchical Modeling for Nano-Electronics
• Excess Noise in Sub-Micron Silicon FET : Transport Theory and Device Optimization
• Experimental Results and Modeling Techniques for Substrate Noise in Mixed-Signal Integrated Circuits (Special Section on the 1992 VLSI Circuits Symposium)
• Mechanism of Surface Charging Effects on Etching Profile Defects

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