Tintori Olivier | L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France

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L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France | 論文

• Performance Degradation Induced by Fringing Field-Induced Barrier Lowering and Parasitic Charge in Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistors with High-κ Dielectrics
• Impact of Geometrical and Electrical Parameters on Speed Performance Characteristics in Ultimate Double-Gate Metal–Oxide–Semiconductor Field-Effect Transistors

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