NAKAYAMA Nobuo | Semiconductor Technology Academic Research Center (STARC)
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概要
Semiconductor Technology Academic Research Center (STARC) | 論文
- Difficulty of Power Supply Voltage Scaling in Large Scale Subthreshold Logic Circuits
- SCR : SPICE Netlist Reduction Tool (Special Section on Selected Papers from the 11th Workshop on Circuits and Systems in Karuizawa)
- Probability Distribution of Threshold Voltage Fluctuations in Metal-OXide-Semiconductor Field-Effect-Transistors : Semiconductors
- Experimental Study of Impact Ionization Phenomena in Sub-0.1 μm Si Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs)
- An Experimental Study of Impact Ionization Phenomena in Sub-0.1μm Si MOSFETs