SAKAMOTO Akihiro | Process Technology Center, OKI Electric Industry Co., Ltd.
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概要
Process Technology Center, OKI Electric Industry Co., Ltd. | 論文
- Improvement of "Soft Breakdown" Leakage of off-State nMOSFETs Induced by HBM ESD Events Using Drain Engineering for LDD Structure (Special Section on Reliability)
- Studies of Corrosive Outgasses from Via Holes Using Thermal Desorption Spectroscopy