Cheng Hui-Wen | Parallel and Scientific Computing Laboratory, Department of Electrical Engineering, National Chiao Tung University, Hsinchu 300, Taiwan

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概要

• 同名の論文著者
• Parallel and Scientific Computing Laboratory, Department of Electrical Engineering, National Chiao Tung University, Hsinchu 300, Taiwanの論文著者

関連著者

• Li Yiming

  Parallel and Scientific Computing Laboratory, Department of Electrical Engineering, National Chiao Tung University, Hsinchu 300, Taiwan

• Cheng Hui-Wen

  Parallel and Scientific Computing Laboratory, Department of Electrical Engineering, National Chiao Tung University, Hsinchu 300, Taiwan

著作論文

• Random Interface-Traps-Induced Electrical Characteristic Fluctuation in 16-nm-Gate High-κ/Metal Gate Complementary Metal-Oxide-Semiconductor Device and Inverter Circuit (Special Issue : Solid State Devices and Materials (2))

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