Inoue Ken | the ULSI Device Development Laboratories, NEC Corporation
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概要
the ULSI Device Development Laboratories, NEC Corporation | 論文
- A High Capacitive Coupling Ratio (HiCR) Cell for Single 3 Volt Power Supply Flash Memories (Special Section on High Speed and High Density Multi Functional LSI Memories)
- A Distributive Serial Multi-Bit Parallel Test Scheme for Large Capacity DRAMs (Special Section on High Speed and High Density Multi Functional LSI Memories)
- Modeling of Channel Boron Distribution in Deep Sub-0.1μm n-MOSFETs (Special Issue on TCAD for Semiconductor Industries)