Tai Takashi | Faculty of Science and Technology, Tokyo University of Science, Noda, Chiba 278-8510, Japan

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概要

関連著者

Furukawa Akio
Faculty of Science and Technology, Tokyo University of Science, Noda, Chiba 278-8510, Japan
Yamaki Kazuhiro
Faculty of Science and Technology, Tokyo University of Science, Noda, Chiba 278-8510, Japan
Tai Takashi
Faculty of Science and Technology, Tokyo University of Science, Noda, Chiba 278-8510, Japan
Kinoshita Junichi
Faculty of Science and Technology, Tokyo University of Science, Noda, Chiba 278-8510, Japan
Sekino Shoji
Green Innovation Research Laboratories, NEC Corporation, Tsukuba, Ibaraki 305-8501, Japan
Nakamura Shin
Green Innovation Research Laboratories, NEC Corporation, Tsukuba, Ibaraki 305-8501, Japan
Yoshitake Tsutomu
Green Innovation Research Laboratories, NEC Corporation, Tsukuba, Ibaraki 305-8501, Japan

著作論文

Thickness Dependences of Resistivity and Temperature Coefficient of Resistance for Ge Thin Films Sandwiched between Si Layers for Uncooled Infrared Imaging Sensor

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