Liu Sheng-Hsien | Ph. D. Program in Electrical and Communications Engineering, Feng Chia University, Taichung 407, Taiwan

スポンサーリンク

概要

• 同名の論文著者
• Ph. D. Program in Electrical and Communications Engineering, Feng Chia University, Taichung 407, Taiwanの論文著者

関連著者

• Chao Tien-sheng

  Department Of Electrophysics National Chiao Tung University

• Hsiao Yu-ping

  Department Of Dermatology Chung Shan Medical University Hospital

• Yang Wen-luh

  Department Of Electronic Engineering Feng Chia University

• Liu Sheng-Hsien

  Ph. D. Program in Electrical and Communications Engineering, Feng Chia University, Taichung 407, Taiwan

著作論文

• Robust Data Retention and Superior Endurance of Silicon-Oxide-Nitride-Oxide-Silicon-Type Nonvolatile Memory with NH-Plasma-Treated and Pd-Nanocrystal-Embedded Charge Storage Layer (Special Issue : Solid State Devices and Materials (2))

スポンサーリンク