DOI TOSHIO | Department of Applied Physics, Faculty of Engineering, Osaka University
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概要
Department of Applied Physics, Faculty of Engineering, Osaka University | 論文
- Monte Carlo Simulation for Auger Depth Profiling of GaAs/AlAs Superlattice Structure by Ar^+ Ion Sputtering
- Auger Depth Profiles of a GaAs/AlAs Superlattice Structure Obtained with O^+_2 and Ar^+ Ion Sputtering
- Anomaly in Sputtering of Aluminum under N^+_2 Ion Bombardment
- Study on Zr-Si/W(100) Surface at High Temperatures by Reflection High Energy Electron Diffraction
- Surface Structure of Ion-Implanted Silica Glass