Ohno Terukazu | NTT System Electronics Laboratories, 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-01, Japan

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概要

関連著者

著作論文

Suppression of Parasitic Bipolar Action and Improvement of Hot-Carrier Reliability in Fully-Depleted Metal-Oxide-Semiconductor Field Effect Transistors on SIMOX (Separation by IMplanted Oxygen) Introducing Recombination Centers near Source Juncti

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