NAKAGAWA Jun | TDK Corporation
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概要
TDK Corporation | 論文
- Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
- Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
- Residual Stress of Multilayer Ceramic Capacitors with Ni-Electrodes (Ni-MLCCs)
- High Speed System for Measuring Electromagnetic Field Distribution(Electromagnetic Compatibility (EMC))
- Generation of a Novel Apoptosis-Resistant Hepatoma Cell Line