Shimizu Hirofumi | Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagawara, Tokusada, Tamura-machi, Koriyama, Fukushima 963-8642, Japan
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概要
- Shimizu Hirofumiの詳細を見る
- 同名の論文著者
- Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagawara, Tokusada, Tamura-machi, Koriyama, Fukushima 963-8642, Japanの論文著者
関連著者
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Shimizu Hirofumi
Department Of Electrical And Electronic Engineering College Of Engineering Nihon University
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Shimizu Hirofumi
Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagawara, Tokusada, Tamura-machi, Koriyama, Fukushima 963-8642, Japan
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Sato Taku
Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagawara, Tokusada, Tamura-machi, Koriyama, Fukushima 963-8642, Japan
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Sato Hirohumi
Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagawara, Tokusada, Tamura-machi, Koriyama, Fukushima 963-8642, Japan
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Nishimura Shigeoki
Department of Capacitor Development, Research and Development Division, Hitachi AIC Inc., 16 Odaira, Miharu, Fukushima 963-7704, Japan
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Honda Mitsutoshi
Hitachi Research Laboratory, Hitachi, Ltd., 7-1-1 Omika-cho, Hitachi, Ibaraki 319-1292, Japan
著作論文
- Electrical Properties of Anodically Oxidized Nb2O5 and Si-Doped Nb2O5 Films
- Kinetics of Ultrathin Thermal Oxide Growth on Si(001) Surfaces