Han Min-Koo | School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
スポンサーリンク
概要
- Han Min-Kooの詳細を見る
- 同名の論文著者
- School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Koreaの論文著者
School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea | 論文
- Reliability in Short-Channel p-Type Polycrystalline Silicon Thin-Film Transistor under High Gate and Drain Bias Stress
- Effect of Drain Bias Stress on Stability of Nanocrystalline Silicon Thin Film Transistors with Various Channel Lengths
- Highly Transparent and High Haze Bilayer Al-Doped ZnO Thin Film Employing Oxygen-Controlled Seed Layer
- High Voltage AlGaN/GaN High-Electron-Mobility Transistors Employing Surface Treatment by Deposition and Removal of Silicon Dioxide Layer
- Novel F-Shaped Triple-Gate Structure for Suppression of Kink Effect and Improvement of Hot Carrier Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistor