Kuo Chao-Wei | SONOS Technology Research Program, eMemory Technology Inc., Jhube, Hsinchu 302, Taiwan

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概要

関連著者

Chiu Yung-Yueh
Institute of Communications Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
Li Fu-Hai
Institute of Communications Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
Lee Yen-Hui
Institute of Communications Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
Chang Ru-Wei
Institute of Communications Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
Yang Bo-Jun
Institute of Communications Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
Sun Wein-Town
SONOS Technology Research Program, eMemory Technology Inc., Jhube, Hsinchu 302, Taiwan
Lee Eric
SONOS Technology Research Program, eMemory Technology Inc., Jhube, Hsinchu 302, Taiwan
Kuo Chao-Wei
SONOS Technology Research Program, eMemory Technology Inc., Jhube, Hsinchu 302, Taiwan
Shirota Riichiro
Institute of Communications Engineering, National Chiao Tung University, Hsinchu 300, Taiwan

著作論文

Study Trapped Charge Distribution in P-Channel Silicon--Oxide--Nitride--Oxide--Silicon Memory Device Using Dynamic Programming Scheme

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