Choi Young | Korea Electrotechnology Research Institute, P.O. Box 20, Changwon, Kyungnam 641-600, Korea
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概要
- Choi Young Wookの詳細を見る
- 同名の論文著者
- Korea Electrotechnology Research Institute, P.O. Box 20, Changwon, Kyungnam 641-600, Koreaの論文著者
関連著者
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Choi Young
Korea Electrotechnology Research Institute, P.O. Box 20, Changwon, Kyungnam 641-600, Korea
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Choi Young
Korea Inst. Of Nuclear Safety
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CHOI Young
Korea Institute of Nuclear Safety
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JHUNG Myung
Korea Institute of Nuclear Safety
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JANG Changheui
KAIST
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Hong Jongin
Department Of Material Science And Engineering Kaist
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Choi Jong
Department Of Archaeology Kyongnam Archaeology Institute
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No Kwang
Department Of Material Science And Engineering Kaist
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Shon Jung
Samsung Electronics Co. Ltd.
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Jhung Myung
Korea Inst. Of Nuclear Safety
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Kim Yang
Department Of Chemistry Sangji University
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Sung Tae-Hyun
Korea Electirc Power Research Institute, Taejon 305-380, Korea
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Kim Sung
Department of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Yongin, Gyeonggi 446-701, Republic of Korea
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KIM Jong
Korea Atomic Energy Research Institute
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Kim Sung
Department of Bioengineering and Technology, College of Engineering, Kangwon National University
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Choi Jong
Department Of Pharmacy Kyungsung University
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Kim Yang
Department Of Infectious Diseases Asan Medical Center
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Kim Jong
Korea Advanced Institute Of Science And Technology (kaist)
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Kim Seok
Korea Food Research Institute Bundang Songnam
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Kim Yang
Department Of Material Science And Engineering Kaist
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Sung Tae-hyun
Korea Electric Power Research Institute
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Kim Sung
Department Of Anatomy
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Lee Hong
Korea Polar Research Institute Kordi
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HONG Jongin
Department of Material Science and Engineering, Korea Advanced Institute of Science and Technology
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Kim S
Department Of Material Science And Engineering Kaist
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Kim Tae
Environmental Technology Research Department R&d Center Korea Heavy Industries & Constructio
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CHANG Yoon
Kyung Hee University
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XU Xiangyuan
Sungkyunkwan University
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Kim Jong
Korea Power Engineering Company
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SHON Jung
Samsung Electronics Co., Ltd.
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NO Kwang
Department of Material Science and Engineering, KAIST
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Kim Seok
Korea Institute Of Nuclear Safety
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Rim Geun
Korea Electrotechnology Research Institute, P.O. Box 20, Changwon, Kyungnam 641-600, Korea
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Shon Jung
Samsung Electronics Co., Ltd., Yongin, Gyeongi-do 433-742, Korea
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Kim Tae
Environmental Technology Research Department, R&D Center, Korea Heavy Industries & Construction Co., Ltd., P.O. Box 77, Changwon, Kyungnam 641-792, Korea
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Song Young
Korea Institute of Machinery & Materials, P.O. Box 101, Yuseong, Taejon 305-343, Korea
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Jang Gil
Environmental Technology Research Department, R&D Center, Korea Heavy Industries & Construction Co., Ltd., P.O. Box 77, Changwon, Kyungnam 641-792, Korea
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Shin Wan
Korea Institute of Machinery & Materials, P.O. Box 101, Yuseong, Taejon 305-343, Korea
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Shin Wan
Korea Institute of Machinery & Materials, P.O. Box 101, Yuseong, Taejon 305-343, Korea
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Kim Yang
Department of Material Science and Engineering, KAIST, 373-1 Kuseung-dong, Yuseung-ku, Taejeon 305-701, Korea
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No Kwang
Department of Material Science and Engineering, KAIST, 373-1 Kuseung-dong, Yuseung-ku, Taejeon 305-701, Korea
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Hong Jongin
Department of Material Science and Engineering, KAIST, 373-1 Kuseung-dong, Yuseung-ku, Taejeon 305-701, Korea
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Choi Jong
Department of Material Science and Engineering, KAIST, 373-1 Kuseung-dong, Yuseung-ku, Taejeon 305-701, Korea
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Lee Hong
Korea Electrotechnology Research Institute, P.O. Box 20, Changwon, Kyungnam 641-600, Korea
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Kim Sung
Department of Material Science and Engineering, KAIST, 373-1 Kuseung-dong, Yuseung-ku, Taejeon 305-701, Korea
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Choi Young
Korea Research Institute of Chemical Technology 100 Jang-dong, Yuseung-ku, Taejon 305-600, Korea
著作論文
- Structural Integrity of Reactor Pressure Vessel for Small Break Loss of Coolant Accident
- Probabilistic Fracture Mechanics Round Robin Analysis of Reactor Pressure Vessels during Pressurized Thermal Shock
- Optical Properties of Thin Amorphous Silicon Film on a Phase Shift Mask for 157nm Lithography
- Analysis of the Pulsed Plasma Reactor Impedance For DeSOx and DeNOx
- Optical Properties of Thin Amorphous Silicon Film on a Phase Shift Mask for 157 nm Lithography