Hara Takefumi | Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japanの論文著者
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan | 論文
- Mechanism of Prism-Coupled Scanning Tunneling Microscope Light Emission
- Prism-Coupled Scanning Tunneling Microscope Light Emission Spectroscopy of Au Film Covered with Self-Assembled Alkanethiol Monolayer
- Ultrahigh-Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy
- Fabrication of Nanometer Silicon Pillars for Buried-Gate-Type Surrounding Gate Transistor by Silicon Quasi-Isotropic Etching
- Ambipolar Behavior in Epitaxial Graphene-Based Field-Effect Transistors on Si Substrate