CHEN Shih-Chang | Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Company
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- Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Companyの論文著者
Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Company | 論文
- Threshold Voltage Instability in nMOSFETs with HfSiO/SiO_2 High-k Gate Stacks
- Effects of Base Oxide and Silicon Composition on Charge Trapping in HfSiO/SiO_2 High-k Gate Stacks