Ahn Chang-Geun | Pohang University of Science and Technology, Department of Electrical Engineering

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• 同名の論文著者
• Pohang University of Science and Technology, Department of Electrical Engineeringの論文著者

Pohang University of Science and Technology, Department of Electrical Engineering | 論文

• Effects of Hydrogen and Deuterium Annealing on Plasma Process-Induced Damages
• Effects of Segregated Ge on Electrical Properties of SiO_2/SiGe Interface
• Effects of Hydrogen and Deuterium Annealing on Plasma Process Induced Damages

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