HWANG Hyun-Sang | Advan. Tech. Lab., LG Semicon Co., Ltd.
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概要
Advan. Tech. Lab., LG Semicon Co., Ltd. | 論文
- Characterization of Corner Induced Leakage Current in Shallow Silicided n^+/p Junction
- Study of Drain Contact Structure Dependent Deep Submicron MOSFET Reliability by Photon Emission Analysis
- Fluorine Induced Reliability Degradation of W-polycide Gate CMOS Device