Mika Filip | Institute of Scientific Instruments of the ASCR, v. v. I.
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概要
Institute of Scientific Instruments of the ASCR, v. v. I. | 論文
- Grain Contrast Imaging in UHV SLEEM
- Profiling N-Type Dopants in Silicon
- Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
- Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films