Ono Kikuo | Hitachi Displays, Ltd., Mobara, Chiba 297-0037, Japan

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概要

• Ono Kikuoの詳細を見る
• 同名の論文著者
• Hitachi Displays, Ltd., Mobara, Chiba 297-0037, Japanの論文著者

関連著者

• Ono Kikuo

  Hitachi Research Laboratory

• Ono Kikuo

  Hitachi Displays, Ltd., Mobara, Chiba 297-0037, Japan

• Tomioka Yasushi

  Materials Research Laboratory, Hitachi, Ltd., Hitachi, Ibaraki 319-1292, Japan

• Utsumi Yuka

  Materials Research Laboratory, Hitachi, Ltd., Hitachi, Ibaraki 319-1292, Japan

• Hiyama Ikuo

  Materials Research Laboratory, Hitachi, Ltd., Hitachi, Ibaraki 319-1292, Japan

• Ono Kikuo

  Hitachi Research Laboratory Hitachi Ltd.

• KONISHI Nobutake

  Hitachi Research Laboratory, Hitachi Ltd.

• Konishi Nobutake

  Hitachi Research Laboratory Hitachi Ltd.

• Takeda Shintaro

  Materials Research Laboratory, Hitachi, Ltd., Hitachi, Ibaraki 319-1292, Japan

• KONISHI Nobutake

  Hitachi Research Laboratory

• Oikawa Soichi

  Department Of Electronics Nagoya University

• Oikawa S

  New Materials Research Center Sanyo Electric Co. Ltd.

• Oikawa S

  Chiba Univ. Chiba Jpn

• Oikawa Setsuko

  Laboratory Of Physical Chemistry Pharmaceutical Sciences Chiba University

• TANAKA Takeshi

  Hitachi Research Laboratory

• OHIDA Jun

  Mobara Works, Hitachi

• OHWADA Junichi

  Mobara Works, Hitachi

• Konishi N

  Hitachi Research Laboratory

• OIKAWA Saburou

  Hitachi Research Laboratory, Hitachi Ltd.

• MIYATA Kenji

  Mobara Works, Hitachi Ltd.

• Ohida Jun

  Mobara Works Hitachi

• Ohwada Junichi

  Mobara Works Hitachi

• Miyata Kenji

  Mobara Works Hitachi Ltd.

• KAGAWA Hiroyuki

  Materials Research Laboratory, Hitachi Ltd.

• Ishii Masahiro

  Hitachi Displays, Ltd., Mobara, Chiba 297-0037, Japan

• Kagawa Hiroyuki

  Materials Research Laboratory, Hitachi, Ltd., Hitachi, Ibaraki 319-1292, Japan

• Kajita Daisuke

  Materials Research Laboratory, Hitachi, Ltd., Hitachi, Ibaraki 319-1292, Japan

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著作論文

• Effects of Line Resistance and Parasitic Capacitance on Transmittance Distribution in TFT-LCDs
• Effect of Channel Implantation on the Device Performance of Low Temperature Processed Polycrystalline Silicon Thin Film Transistors
• Correlation of Light Scattering of Homogenous Alignment Liquid Crystal Layers with Material Properties of Liquid Crystals
• Light Leakage Behaviors of Homogenously Aligned Liquid Crystal Layers Placed between Crossed Polarizers
• Quantitative Analysis Method for Measuring Light Leakage Intensity of Three Primary Color Filters Placed between Crossed Polarizers

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