Yokoi Hideki | Department of Electronic Engineering, Shibaura Institute of Technology, Tokyo 135-8548, Japan
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- Department of Electronic Engineering, Shibaura Institute of Technology, Tokyo 135-8548, Japanの論文著者
Department of Electronic Engineering, Shibaura Institute of Technology, Tokyo 135-8548, Japan | 論文
- Degradation of Electromigration Lifetime of Cu/Low-$k$ Interconnects by Postannealing
- Elimination of Back-Reflected Transverse Electric Mode in Transverse-Magnetic-Mode Optical Isolator with Si Guiding Layer