SASAKI Hideyuki | Environmental Engineering Laboratory, Research and Development Center, Toshiba Corporation
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- SASAKI Hideyukiの詳細を見る
- 同名の論文著者
- Environmental Engineering Laboratory, Research and Development Center, Toshiba Corporationの論文著者
Environmental Engineering Laboratory, Research and Development Center, Toshiba Corporation | 論文
- Interfacial Layers between Si and Ru Films Deposited by Sputtering in Ar/O_2 Mixture Ambient
- Precipitation of Boron in Highly Boron-Doped Silicon
- Anomalous Junction Leakage Behavior of Ti Self Aligned Silicide Contacts on Ultra-Shallow Junctions
- Anomalous Junction Leakage Behavior of Ti-SALICIDE Contacts on Ultra-Shallow Junctions
- 7Li NMR及びESRによるハ-ドカ-ボン中へのリチウム吸蔵状態の解析